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author | Yann Herklotz <git@yannherklotz.com> | 2022-05-31 11:11:14 +0100 |
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committer | Yann Herklotz <git@yannherklotz.com> | 2022-05-31 11:11:14 +0100 |
commit | 0969480f7f1c4f924630b8088a7e7e8fd731a1ff (patch) | |
tree | 43d16518253570d280ef256a4d0ed11711e563a5 /papers.bib | |
parent | 24f4a50873f7ae090589c0b3f007748875738ab0 (diff) | |
download | yannherklotz.com-0969480f7f1c4f924630b8088a7e7e8fd731a1ff.tar.gz yannherklotz.com-0969480f7f1c4f924630b8088a7e7e8fd731a1ff.zip |
Add FCCM'22 paper
Diffstat (limited to 'papers.bib')
-rw-r--r-- | papers.bib | 9 |
1 files changed, 6 insertions, 3 deletions
@@ -4,7 +4,9 @@ year = {2022}, booktitle = {30th {IEEE} Annual Int. Symp. on Field-Programmable Custom Computing Machines (FCCM)}, numpages = 5, - url_artifact = {https://github.com/mpardalos/Vericert-Fun}, + note = {Short paper}, + url_manuscript = {/papers/fccm22_rsvhls.pdf}, + url_artifact = {https://github.com/mpardalos/Vericert-Fun} } @article{OOPSLA '21, @@ -26,9 +28,10 @@ author = {Herklotz, Yann and Du, Zewei and Ramanathan, Nadesh and Wickerson, John}, title = {An Empirical Study of the Reliability of High-Level Synthesis Tools}, year = {2021}, - booktitle = {29th {IEEE} Annual Int. Symp. on Field-Programmable Custom Computing Machines}, + booktitle = {29th {IEEE} Annual Int. Symp. on Field-Programmable Custom Computing Machines (FCCM)}, keywords = {automated testing, compiler defect, compiler testing, random program generation, random testing}, numpages = 5, + note = {Short paper}, doi = {10.1109/FCCM51124.2021.00034}, url_manuscript = {/papers/fccm21_esrhls.pdf}, url_artifact = {https://github.com/ymherklotz/fuzzing-hls}, @@ -38,7 +41,7 @@ author = {Yann Herklotz and John Wickerson}, title = {Finding and Understanding Bugs in {FPGA} Synthesis Tools}, year = 2020, - booktitle = {ACM/SIGDA Int. Symp. on Field-Programmable Gate Arrays}, + booktitle = {ACM/SIGDA Int. Symp. on Field-Programmable Gate Arrays (FPGA)}, doi = {10.1145/3373087.3375310}, isbn = {978-1-4503-7099-8/20/02}, keywords = {automated testing, compiler defect, compiler testing, random program generation, random testing}, |