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authorYann Herklotz <git@yannherklotz.com>2022-05-31 11:11:14 +0100
committerYann Herklotz <git@yannherklotz.com>2022-05-31 11:11:14 +0100
commit0969480f7f1c4f924630b8088a7e7e8fd731a1ff (patch)
tree43d16518253570d280ef256a4d0ed11711e563a5 /papers.bib
parent24f4a50873f7ae090589c0b3f007748875738ab0 (diff)
downloadyannherklotz.com-0969480f7f1c4f924630b8088a7e7e8fd731a1ff.tar.gz
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Add FCCM'22 paper
Diffstat (limited to 'papers.bib')
-rw-r--r--papers.bib9
1 files changed, 6 insertions, 3 deletions
diff --git a/papers.bib b/papers.bib
index 1a98af9..68006a8 100644
--- a/papers.bib
+++ b/papers.bib
@@ -4,7 +4,9 @@
year = {2022},
booktitle = {30th {IEEE} Annual Int. Symp. on Field-Programmable Custom Computing Machines (FCCM)},
numpages = 5,
- url_artifact = {https://github.com/mpardalos/Vericert-Fun},
+ note = {Short paper},
+ url_manuscript = {/papers/fccm22_rsvhls.pdf},
+ url_artifact = {https://github.com/mpardalos/Vericert-Fun}
}
@article{OOPSLA&nbsp;&#39;21,
@@ -26,9 +28,10 @@
author = {Herklotz, Yann and Du, Zewei and Ramanathan, Nadesh and Wickerson, John},
title = {An Empirical Study of the Reliability of High-Level Synthesis Tools},
year = {2021},
- booktitle = {29th {IEEE} Annual Int. Symp. on Field-Programmable Custom Computing Machines},
+ booktitle = {29th {IEEE} Annual Int. Symp. on Field-Programmable Custom Computing Machines (FCCM)},
keywords = {automated testing, compiler defect, compiler testing, random program generation, random testing},
numpages = 5,
+ note = {Short paper},
doi = {10.1109/FCCM51124.2021.00034},
url_manuscript = {/papers/fccm21_esrhls.pdf},
url_artifact = {https://github.com/ymherklotz/fuzzing-hls},
@@ -38,7 +41,7 @@
author = {Yann Herklotz and John Wickerson},
title = {Finding and Understanding Bugs in {FPGA} Synthesis Tools},
year = 2020,
- booktitle = {ACM/SIGDA Int. Symp. on Field-Programmable Gate Arrays},
+ booktitle = {ACM/SIGDA Int. Symp. on Field-Programmable Gate Arrays (FPGA)},
doi = {10.1145/3373087.3375310},
isbn = {978-1-4503-7099-8/20/02},
keywords = {automated testing, compiler defect, compiler testing, random program generation, random testing},